Accelerated Testing : Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics)
by: Wayne B. Nelson
Topics include: mean log life, good compromise plans, reallocated plan, lognormal life distribution, series system model, inverse power relationship, optimum test plans, equally spaced test, product life distribution, same life distribution, multivariable relationships, failure censored data, normal confidence limits, test stress levels, including nonfailures, extreme value plot, four test temperatures, model and complete data, cumulative exposure model, multiply censored data, constrained log likelihood, extreme value scale parameter, parallel disk electrodes, four stress levels, constant scale parameter
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Book Description -- This practical resource presents modern, statistical methods for accelerated testing including test models, analyses of data, and plans for testing. Each topic is self-contained for easy reference. Coverage is broad and detailed enough to serve as a text or reference. This handy book features real test examples along with data analyses, computer programs, and references to the literature.
The publisher, John Wiley & Sons -- In recent years, much useful methodology has been developed in accelerated testing--this book makes it available to practitioners. Many products last so long that life testing at design conditions is impractical. However, these products can be life-tested at high-stress conditions to yield failures quickly. Such testing saves much time and money--and analyses of data from an accelerated test yield needed information on product life at design (low stress) conditions. Presents practical, modern, statistical methods for accelerated testing including test models, analyses of data and plans for testing. Each topic is self-contained for easy reference. Coverage is broad and detailed enough to serve as a text or reference. Contains many real test examples along with data analyses, computer programs and references to the literature.--
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